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CHERRY HILL, NJ, December 20, 2010 - inTEST Corporation (Nasdaq: INTT), an independent designer, manufacturer and marketer of semiconductor automatic test equipment (ATE) interface solutions and temperature management products, today announced that it is scheduled to present at the 13th Annual Needham Growth Conference on Thursday, January 13, 2011 at the New York Palace Hotel in New York City.

Robert E. Matthiessen, President and Chief Executive Officer, and Hugh T. Regan, Jr., Treasurer and Chief Financial Officer, will be hosting meetings with investors to discuss the Company's financial performance, business trends and growth opportunities. Presentation materials will be made available on the investor relations section of the Company's website at

About inTEST Corporation

inTEST Corporation is an independent designer, manufacturer and marketer of ATE interface solutions and temperature management products, which are used by semiconductor manufacturers to perform final testing of integrated circuits (ICs) and wafers. The Company's high-performance products are designed to enable semiconductor manufacturers to improve the speed, reliability, efficiency and profitability of IC test processes. Specific products include positioner and docking hardware products, temperature management systems and customized interface solutions. The Company has established strong relationships with semiconductor manufacturers globally, which it supports through a network of local offices. For more information visit

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